• DocumentCode
    1237315
  • Title

    Engineering Multiwalled Carbon Nanotubes Inside a Transmission Electron Microscope Using Nanorobotic Manipulation

  • Author

    Dong, Lixin ; Shou, Kaiyu ; Frutiger, Dominic R. ; Subramanian, Arunkumar ; Zhang, Li ; Nelson, Bradley J. ; Tao, Xinyong ; Zhang, Xiaobin

  • Author_Institution
    Inst. of Robot. & Intell. Syst., ETH Zurich, Zurich
  • Volume
    7
  • Issue
    4
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    508
  • Lastpage
    517
  • Abstract
    This paper provides a review of recent experimental techniques developed for shell engineering individual multiwalled carbon nanotubes (MWNTs). Basic processes for the nanorobotic manipulation of MWNTs inside a transmission electron microscope are investigated. MWNTs, bamboo-structured carbon nanotubes (CNTs), Cu-filled CNTs, and CNTs with quantum dots attached are used as test structures for manipulation. Picking is realized using van der Waals forces, ldquostickyrdquo probes, electron-beam-induced deposition, and electric breakdown. Cap opening and shell shortening are presented using field emission current. Controlled peeling and thinning of the shells of MWNTs are achieved by electric breakdown, and changes in MWNT structures are correlated with electrical measurements. These processes are fundamental for the characterization of nanoscale materials, the structuring of nanosized building blocks, and the prototyping of nanoelectromechanical systems.
  • Keywords
    carbon nanotubes; electric breakdown; electron beam deposition; nanotechnology; transmission electron microscopy; van der Waals forces; C; bamboo-structured carbon nanotubes; electric breakdown; electron-beam-induced deposition; field emission current; multiwalled carbon nanotubes; nanoelectromechanical systems; nanorobotic manipulation; quantum dots; transmission electron microscope; van der Waals forces; Carbon nanotubes; Carbon nanotubes (CNTs); nanorobotic manipulation; shell engineering; transmission electron microscope; transmission electron microscope (TEM);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.926443
  • Filename
    4531958