• DocumentCode
    1237496
  • Title

    A grain detection system for grain-oriented electrical steels

  • Author

    Mohd Ali, B.B. ; Moses, A.J.

  • Author_Institution
    Eng. Fac., Univ. Pertanian Malaysia, Selangor, Malaysia
  • Volume
    25
  • Issue
    6
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    4421
  • Lastpage
    4426
  • Abstract
    A microcomputer-based apparatus for the detection of grain structures in grain-oriented electrical steels has been developed. The apparatus enables observation of grain structures to be made through the stress coatings. The localized magnetic field distribution on the surface of the electrical steel is mapped using a pair of monolithic thin-film magnetoresistive heads (MRHs) made from Permalloy (82%-18% Ni-Fe). A uniform field distribution within an area indicates a single grain, whereas a discontinuous structure represented by sudden jumps in magnitude and/or direction of the field vectors indicates a grain boundary. The MRH scans the sample at regular intervals by means of a computer-controlled mechanical scanner, and the local field values detected can be stored in a computer for subsequent processing. The magnitudes and directions of the vectors computed from the components detected by a pair of MRHs controlled by a minicomputer were plotted with a high-resolution plotter. The plots showed that most of the grains (approximately 90%) in the samples were detected. The correlation between the grain orientation and the vector magnitude, and the effect of surface defects on the samples, were also studied
  • Keywords
    crystal microstructure; ferromagnetic properties of substances; grain boundaries; iron alloys; magnetic surface phenomena; metallography; microcomputer applications; physics computing; silicon alloys; Fe-Si; MRH; Ni-Fe; Permalloy; computer-controlled mechanical scanner; grain boundary; grain detection system; grain orientation; grain structures; grain-oriented electrical steels; high-resolution plotter; localized magnetic field distribution; magnetic domains; microcomputer-based apparatus; minicomputer; monolithic thin-film magnetoresistive heads; stress coatings; surface defects; Coatings; Hall effect devices; Magnetic fields; Magnetic heads; Magnetic sensors; Magnetization; Magnetoresistance; Scanning electron microscopy; Steel; Stress;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.45322
  • Filename
    45322