DocumentCode
1237881
Title
TTTC Newsletter
Author
Kim, Bruce C.
Volume
25
Issue
3
fYear
2008
Firstpage
286
Lastpage
287
Abstract
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords
ATS; DFT; ETS; IMS3TW; IOLTS; NDCS; TTTC; WRTLT; test technology;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.86
Filename
4534177
Link To Document