Title :
1989 IEEE Annual Nuclear and Space Radiation Effects Conference
Abstract :
The following topics are dealt with: basic mechanisms of radiation effects; dosimetry and energy-dependent effects; hardness assurance and testing techniques; EMP/SGEMP/IEMP phenomena; device radiation effects and hardening; radiation effects on isolation technologies, and single-event phenomena
Keywords :
dosimetry; electromagnetic interference; electromagnetic pulse; radiation effects; radiation hardening (electronics); semiconductor device testing; EMP; IEMP; SGEMP; dosimetry; energy-dependent effects; hardening; hardness assurance; isolation technologies; radiation effects; single-event phenomena; testing techniques; Dosimetry; EMP radiation effects; Electromagnetic interference; Radiation effects; Radiation hardening; Semiconductor device testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
