• DocumentCode
    1239981
  • Title

    Quench characteristics of fault current limiting element with YBCO thin film

  • Author

    Shimohata, K. ; Yokoyama, S. ; Inaguchi, T. ; Nakamura, S. ; Yasuda, Kenji

  • Author_Institution
    Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    13
  • Issue
    2
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    2108
  • Lastpage
    2111
  • Abstract
    It is important with a resistance type current limiting element to make quench occur uniformly over the whole area of the element. Current limiting experiments were carried out to find out the quench characteristics of some specifications of elements with YBCO thin films. In the experiments, applied voltage, fault duration and short-circuit phase were changed. As a result, uniform or local quench was observed. The films were damaged at about 500 K. Moreover, a current limiting simulation considering the dispersion of critical current was compared with the experimental results. The calculated results agreed with the experimental results.
  • Keywords
    barium compounds; fault current limiters; high-temperature superconductors; short-circuit currents; superconducting devices; superconducting thin films; yttrium compounds; 500 K; YBCO thin film; YBaCuO; quench characteristics; resistive superconducting fault current limiter; short-circuit current; Critical current; Current limiters; Fault currents; Gold; Power system simulation; Superconducting films; Superconducting thin films; Transistors; Voltage; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2003.812996
  • Filename
    1212034