DocumentCode :
1239981
Title :
Quench characteristics of fault current limiting element with YBCO thin film
Author :
Shimohata, K. ; Yokoyama, S. ; Inaguchi, T. ; Nakamura, S. ; Yasuda, Kenji
Author_Institution :
Mitsubishi Electr. Corp., Hyogo, Japan
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
2108
Lastpage :
2111
Abstract :
It is important with a resistance type current limiting element to make quench occur uniformly over the whole area of the element. Current limiting experiments were carried out to find out the quench characteristics of some specifications of elements with YBCO thin films. In the experiments, applied voltage, fault duration and short-circuit phase were changed. As a result, uniform or local quench was observed. The films were damaged at about 500 K. Moreover, a current limiting simulation considering the dispersion of critical current was compared with the experimental results. The calculated results agreed with the experimental results.
Keywords :
barium compounds; fault current limiters; high-temperature superconductors; short-circuit currents; superconducting devices; superconducting thin films; yttrium compounds; 500 K; YBCO thin film; YBaCuO; quench characteristics; resistive superconducting fault current limiter; short-circuit current; Critical current; Current limiters; Fault currents; Gold; Power system simulation; Superconducting films; Superconducting thin films; Transistors; Voltage; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.812996
Filename :
1212034
Link To Document :
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