DocumentCode
1241028
Title
Buffer layers for Tl-2212 thin films on MgO and sapphire substrates
Author
Speller, Susannah C. ; Wu, Houzheng ; Grovenor, Chris R M
Author_Institution
Dept. of Mater., Univ. of Oxford, UK
Volume
13
Issue
2
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
2713
Lastpage
2716
Abstract
High quality Tl-2212 films can be readily grown on LaAlO3 substrates, but the design of complex microwave devices in these films is made more difficult by the twinning of the substrate. CeO2 buffer layers on sapphire have been previously demonstrated to offer excellent substrates for Tl-2212 films. We have been exploring alternative architectures for buffer layers on MgO and sapphire. Epitaxial Tl-2212 superconducting thin films have been successfully grown on Gd2O3-buffered MgO substrates by sputter deposition of a Tl-free precursor followed by an ex-situ thalliation anneal. The Tl-2212 films were aligned with the c-axis normal to the film surface, and also had excellent in-plane orientation with Tl-2212 [100] aligned with the Gd2O3 and MgO [110]. The critical temperatures of the films ranged from 100 - 103 K and transport and inductive critical current densities of 7.5 × 105 A/cm2 at 77 K have been achieved. We have also fabricated epitaxial GdAlO3 buffer layers on sapphire substrates which support epitaxial growth of Tl-2212 but with relatively poor microstructure. High quality films have been prepared on the new (La,Sr)(Al,Ta)O3 (LSAT) substrates.
Keywords
barium compounds; calcium compounds; critical current density (superconductivity); gadolinium compounds; high-temperature superconductors; magnesium compounds; sapphire; sputter deposition; substrates; superconducting epitaxial layers; superconducting transition temperature; thallium compounds; (La,Sr)(Al,Ta)O3 substrates; (LaSr)(AlTa)O3; 100 to 103 K; 77 K; Al2O3; Gd2O3; Gd2O3-buffered MgO; GdAlO3; MgO; MgO substrates; Tl-2212 thin films; Tl-free precursor; Tl2Ba2Ca1Cu2O8; buffer layers; critical current densities; critical temperatures; epitaxial Tl-2212 superconducting thin films; epitaxial growth; ex-situ thalliation anneal; in-plane orientation; microstructure; sapphire substrates; sputter deposition; Annealing; Buffer layers; Critical current density; Sputtering; Substrates; Superconducting films; Superconducting microwave devices; Superconducting thin films; Temperature distribution; Transistors;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2003.812393
Filename
1212180
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