• DocumentCode
    1241832
  • Title

    The direct measurement of dose enhancement in gamma test facilities

  • Author

    Burke, E.A. ; Lowe, L.F. ; Snowden, D.P. ; Capelli, J.R. ; Mittleman, S.

  • Author_Institution
    Mission Res. Corp., San Diego, CA, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    1890
  • Lastpage
    1895
  • Abstract
    The design and use of a dual-cavity ionization chamber for routine measurement of dose-enhancement factors in Co-60 gamma test facilities are described. The enhancement factors can be derived directly from the chamber measurements without recourse to reference data that may be difficult to obtain. It is shown, in agreement with earlier work, that the maximum dose-enhancement factors can be altered by a factor of two as a result of Compton scatter from relatively small amounts of low- or high-atomic-number materials next to the target. The dual chamber permits the ready detection of such effects. This relatively simple device reliably reproduced earlier results obtained by more involved equipment and procedures. The chamber can be calibrated to give an absolute dose reading for silicon, gallium arsenide, or any other material together with the associated enhancement factor. Measured enhancement factors are also reported for material combinations not previously examined and compared with recent calculations
  • Keywords
    dosimetry; gamma-ray detection and measurement; ionisation chambers; 60Co gamma test facilities; Compton scatter; absolute dose reading; dose-enhancement factors; dosimetry; dual-cavity ionization chamber; Atomic measurements; Dosimetry; Electromagnetic scattering; Electronic equipment testing; Electrons; Ionization chambers; Particle scattering; System testing; Test facilities; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.45383
  • Filename
    45383