Irradiation of LWIR detectors with X-rays generated near the sample

Author

Flesner, L.D. ; O´Brien, M.E. ; Rogers, C.G. ; Moore, T.G.

Author_Institution

US Naval Ocean Syst. Center, San Diego, CA, USA

Volume

36

Issue

6

fYear

1989

fDate

12/1/1989 12:00:00 AM

Firstpage

1920

Lastpage

1925

Abstract

A novel approach for testing the effects of ionizing radiation on long-wavelength infrared (LWIR) detectors operating in a thermally shielded environment is described. An electron beam is introduced into a cryogenic chamber and used to generate low-energy X-rays in a cold target foil proximate to the detector. Applications of the method include studies of ionization-induced noise and accumulated dose. The advantages of the approach include economy of apparatus, very high potential dose rates, ease of modulation, and safety of operation

Keywords

X-ray effects; electron device noise; infrared detectors; semiconductor device testing; LWIR detector irradiation; X-ray irradiation; accumulated dose; cold target foil; cryogenic chamber; ionising radiation effect testing; ionization-induced noise; long wavelength infrared detector; near-surface X-ray generation; operation safety; thermally shielded environment; Cryogenics; Electron beams; Infrared detectors; Ionizing radiation; Radiation detectors; Safety; Testing; Working environment noise; X-ray detection; X-ray detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.45387

Filename

45387