DocumentCode
1242011
Title
Relationship between physical parameters and electrical parameters for recordable disk
Author
Yue, Hongda ; Windeln, Wilbert
Author_Institution
STEAG ETA-Optik GmbH, Heinsberg, Germany
Volume
41
Issue
2
fYear
2005
Firstpage
1009
Lastpage
1011
Abstract
The key to control the disk process and quality is to find the relationship between process parameters and the disk electrical capabilities. This is done in two steps: the first step is from process parameters to physical parameters, and the second step is from physical parameters to electrical parameters. While the first step is based on test experiments and process analysis, the second step is based on simulation, which is introduced in this paper.
Keywords
optical disc storage; disk electrical capabilities; disk process; disk quality; electrical parameters; physical parameters; quality control; recordable disk; simulation model; Analytical models; Coatings; Diffraction; Electric variables measurement; Laser theory; Optical recording; Process control; Production; Sputtering; Testing; Electrical parameters; physical parameters; quality control; recordable disk; simulation model;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2004.842052
Filename
1396284
Link To Document