• DocumentCode
    1242011
  • Title

    Relationship between physical parameters and electrical parameters for recordable disk

  • Author

    Yue, Hongda ; Windeln, Wilbert

  • Author_Institution
    STEAG ETA-Optik GmbH, Heinsberg, Germany
  • Volume
    41
  • Issue
    2
  • fYear
    2005
  • Firstpage
    1009
  • Lastpage
    1011
  • Abstract
    The key to control the disk process and quality is to find the relationship between process parameters and the disk electrical capabilities. This is done in two steps: the first step is from process parameters to physical parameters, and the second step is from physical parameters to electrical parameters. While the first step is based on test experiments and process analysis, the second step is based on simulation, which is introduced in this paper.
  • Keywords
    optical disc storage; disk electrical capabilities; disk process; disk quality; electrical parameters; physical parameters; quality control; recordable disk; simulation model; Analytical models; Coatings; Diffraction; Electric variables measurement; Laser theory; Optical recording; Process control; Production; Sputtering; Testing; Electrical parameters; physical parameters; quality control; recordable disk; simulation model;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2004.842052
  • Filename
    1396284