Title :
Investigations on the correlation between IC-conducted emission and chip-level power supply current
Author :
Fiori, Franco ; Musolino, Francesco
Author_Institution :
Dept. of Electr. Eng., Politecnico di Torino, Italy
Abstract :
This work deals with the control by design of digital integrated circuits conducted emission. In particular, it describes a technique to correlate the conducted emission of a digital integrated circuit (IC) with the power supply currents absorbed by its building blocks. Such a correlation allows one to derive the maximum allowable limits of current spectra at chip level in order to fulfill IC-conducted emission specifications.
Keywords :
digital integrated circuits; electromagnetic compatibility; integrated circuit design; power supply circuits; printed circuits; IC-conducted emission; chip-level power supply current; current spectra; digital integrated circuit; Circuit testing; Current measurement; Current supplies; Digital integrated circuits; Electromagnetic compatibility; Electromagnetic radiation; Measurement standards; Microcontrollers; Packaging; Power supplies;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2004.842203
