Measurements of the low-frequency-gain fluctuations of a 30-GHz high-electron-mobility-transistor cryogenic amplifier

Author

Jarosik, Norman C.

Author_Institution

Dept. of Phys., Princeton Univ., NJ, USA

Volume

44

Issue

2

fYear

1996

fDate

2/1/1996 12:00:00 AM

Firstpage

193

Lastpage

197

Abstract

Low-frequency-gain fluctuations of a 30-GHz cryogenic HEMT amplifier have been measured with the input of the amplifier connected to a 15-K load. Effects of fluctuations of other components of the test set-up were eliminated by use of a power-power correlation technique. Strong correlation between output power fluctuations of the amplifier and drain current fluctuations of the transistors comprising the amplifier are observed. The existence of these correlations introduces the possibility of regressing some of the excess noise from the HEMT amplifier´s output using the measured drain currents

Keywords

HEMT circuits; circuit noise; correlation methods; cryogenic electronics; microwave amplifiers; microwave circuits; 30 GHz; HEMT cryogenic amplifier; drain current fluctuations; excess noise; fluctuations; low-frequency-gain fluctuations; output power fluctuations; power-power correlation technique; Bandwidth; Chromium; Extraterrestrial measurements; Fluctuations; HEMTs; Power amplifiers; Radiofrequency amplifiers; Radiometers; Stability; Testing;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.481567

Filename

481567