DocumentCode :
1243471
Title :
A monolithic DC temperature compensation bias scheme for multistage HEMT integrated circuits
Author :
Kobayashi, Kevin W. ; Jones, William L. ; MacGowan, Keven ; Kono, Richard ; Lee, Ling-Shine Jane
Author_Institution :
Electron. & Technol. Div., TRW Inc., Redondo Beach, CA, USA
Volume :
44
Issue :
2
fYear :
1996
fDate :
2/1/1996 12:00:00 AM
Firstpage :
261
Lastpage :
268
Abstract :
This work benchmarks the first demonstration of a multistage monolithic HEMT IC design which incorporates a DC temperature compensated current-mirror bias scheme. This is believed to be the first demonstrated monolithic HEMT bias scheme of its kind. The active bias approach has been applied to a 2-18 GHz five-section low noise HEMT distributed amplifier which achieves a nominal gain of 12.5 dB and a noise figure <2.5 dB across a 2-18 GHz band, The regulated current-mirror scheme achieves better than 0.2% current regulation over a 0-125°C temperature range, The RF gain response was also measured over the same temperature range and showed less than 0.75 dB gain degradation. This results in a -0.006 dB/°C temperature coefficient which is strictly due to HEMT device Gm variation with temperature. The regulated current-mirror circuit can be employed as a stand-alone Vgs-voltage reference circuit which fan be monolithically applied to the gate bias terminal of existing HEMT ICs for providing temperature compensated performance, This monolithic bias approach provides a practical solution to DC bias regulation and temperature compensation for HEMT MMICs which can improve the performance, reliability, and cost of integrated microwave assemblies (IMAs) used in space-flight military applications
Keywords :
HEMT integrated circuits; MMIC amplifiers; compensation; distributed amplifiers; field effect MMIC; integrated circuit reliability; microwave amplifiers; reference circuits; space vehicle electronics; 0 to 125 degC; 12.5 dB; 2 to 18 GHz; DC temperature compensation bias; HEMT distributed amplifier; MMIC; RF gain response; current-mirror bias scheme; gain degradation; multistage HEMT integrated circuits; reliability; space-flight military applications; stand-alone voltage reference circuit; Active noise reduction; Current control; Distributed amplifiers; Gain; HEMTs; Integrated circuit noise; Monolithic integrated circuits; Noise figure; Radio frequency; Temperature distribution;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.481575
Filename :
481575
Link To Document :
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