DocumentCode :
1244254
Title :
2005 IEEE International Electron Devices Meeting
Volume :
5
Issue :
3
fYear :
2005
Firstpage :
616
Lastpage :
616
Abstract :
Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2005.862064
Filename :
1545927
Link To Document :
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