DocumentCode :
1245354
Title :
Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range
Author :
Shimabukuro, Fred I. ; Yeh, C.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
Volume :
36
Issue :
7
fYear :
1988
fDate :
7/1/1988 12:00:00 AM
Firstpage :
1160
Lastpage :
1166
Abstract :
A dielectric waveguide shorted at both ends was constructed as a cavity resonator. By measuring the Q of this cavity, one can determine the attenuation constant of this guided mode on this dielectric structure. The complex permittivity of the dielectric waveguide material can also be derived from the measurements. Measurements were made at Ka-band for dielectric waveguides constructed of nonpolar, low-loss polymers, such as Teflon, polypropylene, polyethylene, polystyrene, and rexolite
Keywords :
Q-factor measurement; attenuation measurement; cavity resonators; dielectric waveguides; microwave measurement; polymers; EHF; Ka-band; MM waves; Q-factor measurement; SMMW; THF; Teflon; attenuation measurement; cavity resonator method; complex permittivity; dielectric waveguide shorted at both ends; low loss dielectric waveguides; low-loss polymers; millimetre waves; polyethylene; polypropylene; polystyrene; rexolite; sub MM waves; submillimeter waves; Attenuation measurement; Cavity resonators; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Permittivity measurement; Polyethylene; Polymers; Q measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.3651
Filename :
3651
Link To Document :
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