DocumentCode
1246178
Title
Optimal CFAR detection in Weibull clutter
Author
Anastassopoulos, Vassilis ; Lampropoulos, George A.
Author_Institution
Toronto Res. & Dev. Labs., A.U.G. Signals Ltd., Toronto, Ont., Canada
Volume
31
Issue
1
fYear
1995
Firstpage
52
Lastpage
64
Abstract
Optimal, in the maximum likelihood sense, constant false-alarm rate (CFAR) detection for Weibull clutter statistics, is investigated. The proposed OW (optimal Weibull) estimator is proved to be an asymptotically efficient estimator of the mean power of the Weibull clutter. Theoretical analysis of the OW-CFAR detector is provided, while detection performance analysis is carried out using the Monte Carlo simulation method. The operation of the median and morphological (MEMO)-CFAR detector in Weibull clutter statistics is also explained. It performs almost optimally in uniform clutter and, simultaneously, it is robust in multitarget situations. The performance of the proposed OW-CFAR detector in uniformal Weibull clutter is used as a yardstick in the analysis of the MEMO cell-averager (CA) and ordered statistic (OS) CFAR detectors. Nonfluctuating and fluctuating (Swerling II) targets are considered in detection analysis. The performance of the detectors is also examined at clutter edges.<>
Keywords
Monte Carlo methods; Weibull distribution; maximum likelihood detection; performance evaluation; radar clutter; radar detection; target tracking; MEMO cell-averager; Monte Carlo simulation; Swerling II targets; Weibull clutter; Weibull clutter statistics; asymptotically efficient estimator; clutter edges; constant false-alarm rate detection; detection performance analysis; fluctuating targets; maximum likelihood sense; mean power; median and morphological-CFAR detector; morphological-CFAR detector; multitarget situations; nonfluctuating targets; optimal CFAR detection; optimal Weibull estimator; ordered statistic CFAR detectors; Clutter; Degradation; Detectors; Maximum likelihood detection; Maximum likelihood estimation; Parametric statistics; Performance analysis; Research and development; Robustness; Statistical analysis;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/7.366292
Filename
366292
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