DocumentCode
1247048
Title
The design and characterization of micromachined air-coupled capacitance transducers
Author
Schindel, David W. ; Hutchins, David A. ; Zou, Lichun ; Sayer, Michael
Author_Institution
Dept. of Phys., Queen´´s Univ., Kingston, Ont., Canada
Volume
42
Issue
1
fYear
1995
Firstpage
42
Lastpage
50
Abstract
Air-coupled capacitance transducers have been manufactured using anisotropically etched silicon backplates and commercially available dielectric films (Kapton and Mylar). The small backplate pits which result from etching, provide well ordered and highly uniform air layers between the backplate surface and thin dielectric film. Such uniformity allows the transducers to be manufactured with reproducible characteristics (a property difficult to achieve through conventional manufacturing). Impulse response studies in generation and detection, have indicated well-damped, wideband behavior, with bandwidths extending from <100 kHz to 2.3 MHz (at the -6 dB points). These bandwidths are investigated as a function of excitation pulse width, applied bias potential, and dielectric film thickness. An estimate of detection sensitivity is also provided by comparison with a calibrated laser interferometer.<>
Keywords
acoustic transducers; capacitance measurement; dielectric thin films; elemental semiconductors; micromachining; microsensors; silicon; transient analysis; transient response; ultrasonic transducers; 100 kHz to 2.3 MHz; air-coupled capacitance transducers; anisotropically etched silicon backplates; applied bias potential; calibrated laser interferometer; detection sensitivity; dielectric film thickness; dielectric films; excitation pulse width; impulse response studies; micromachining; reproducible characteristics; wideband behavior; Anisotropic magnetoresistance; Bandwidth; Capacitance; Dielectric films; Etching; Laser excitation; Manufacturing; Silicon; Transducers; Wideband;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.368314
Filename
368314
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