Title :
An orthogonality-based deembedding technique for microstrip networks
Author :
Spowart, Michael P. ; Kuester, Edward F.
Author_Institution :
Atmos. Technol. Div., Nat. Center for Atmos. Res., Boulder, CO, USA
fDate :
3/1/2005 12:00:00 AM
Abstract :
This paper introduces a new orthogonality-based method of extracting scattering parameters (deembedding) from numerical current distributions on microstrip networks. All deembedding methods require sufficient length in the network feed lines that only a fundamental mode arrives at the discontinuity. In our new method, the length of feed lines used to excite a network with only a fundamental mode can be shortened compared with other methods. On that basis, this new method can be used to improve other deembedding methods. Estimates of end susceptance and end conductance of the open-end discontinuity are used for performance evaluation. End conductance computations are highly sensitive to errors in computed numerical reflection coefficients, making the accurate analysis of the open-end discontinuity a particularly challenging deembedding example. Results show that the orthogonality-based method is both stable and accurate. In the case of the open-end discontinuity, significant improvement in performance compared to other deembedding techniques can be achieved.
Keywords :
S-parameters; current distribution; electric admittance; electric field integral equations; method of moments; microstrip circuits; multiport networks; passive networks; computed numerical reflection coefficients; electric field integral equations; end conductance computations; end susceptance; method of moments; microstrip networks; network feed lines; numerical current distributions; open-end discontinuity; orthogonality based deembedding method; performance evaluation; scattering parameters extraction; Circuits; Current density; Current distribution; Feeds; Microstrip; Moment methods; Propagation constant; Scattering parameters; Transmission lines; Voltage; Deembedding; Lorentz reciprocity; end capacitance; end conductance; end susceptance; method of moments (MoM); microstrip networks; modal analysis; orthogonal decomposition;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.842487