DocumentCode :
1249571
Title :
Reliability assessment from fatigue micro-crack data
Author :
Wilson, Simon P. ; Taylor, David
Author_Institution :
Trinity Coll., Dublin, Ireland
Volume :
46
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
165
Lastpage :
172
Abstract :
Micro-cracks are generally defined to be cracks less than 1 mm in length, which propagate under cyclic stresses until they grow large and cause failure in an item (e.g. component or structure). This paper proposes a method of using data on `fatigue micro-crack growth in a material´ to predict its reliability. It is increasingly important to model such cracks effectively, Their growth properties, which differ in several respects from larger cracks, are discussed. The paper develops a hierarchical model for the propagation of micro-cracks in a material. This stochastic model attempts to model the dependence of growth on local conditions, varying throughout the material, that causes variation in growth rates across the specimen. Given the model, data on micro-crack growth are used to compute posterior distributions of model parameters, from which a predictive distribution for reliability can be calculated. Computation of the posterior distributions is by Gibb´s sampling and kernel density estimation. The methodology is illustrated with two data sets, one simulated and the other from a cast-iron specimen. Some possibilities for further work are presented
Keywords :
Bayes methods; failure analysis; fatigue cracks; microcracks; reliability theory; stochastic processes; Bayes inference; Gibb´s sampling; cast-iron specimen; coalescence; component failure; crack growth properties; cyclic stresses; fatigue micro-crack growth; hierarchical model; kernel density estimation; posterior distributions; predictive distribution; reliability assessment; stochastic model; Conducting materials; Delay effects; Differential equations; Fatigue; Grain boundaries; Microstructure; Propagation delay; Stochastic processes; Stress;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.589943
Filename :
589943
Link To Document :
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