Title :
A distribution-free lower bound for availability of quantile-based inspection schemes
Author :
Yang, Yoonjung ; Klutke, Georgia-Ann
Author_Institution :
Samsung Electron. Co., Ltd, Kyunggi-Do, South Korea
fDate :
12/1/2001 12:00:00 AM
Abstract :
This paper develops a lower bound for the availability of quantile-based inspection schemes when device lifetimes are assumed to have an increasing failure rate. The lower bound is useful in designing inspection schemes when lifetime distributions are not explicitly known, but must be estimated from limited failure data
Keywords :
failure analysis; inspection; life testing; reliability; device lifetimes; distribution-free lower bound; increasing failure rate; inspection policy; inspection rate; inspection schemes; lifetime distributions; limited failure data; quantile-based inspection schemes availability; Availability; Circuit breakers; Distribution functions; H infinity control; Industrial engineering; Inspection; Life estimation; Lifetime estimation; Protection; Shape;
Journal_Title :
Reliability, IEEE Transactions on
