Title :
Properties of complex parameters of five-port reflectometer with E-plane oblique X- and T-junctions
Author :
Karlov, V.A. ; Andreev, Mikhail V. ; Borulko, V.F.
Author_Institution :
Dept. of Phys., Electron. & Comput. Syst., Oles Honchar Dnipropetrovsk Nat. Univ., Dnipropetrovsk, Ukraine
Abstract :
The problem of creating meter of complex reflection coefficient based on the electromagnetic approach using E-plane dividers is studied. Rigorous electromagnetic model of direct and inverse problems of five-port measurements of complex reflection coefficient is derived. Frequency dependencies of model parameters are calculated. Properties of oblique X- and T-junctions are investigated.
Keywords :
power dividers; reflectometers; spectral analysers; waveguide junctions; E-plane divider; E-plane oblique X-junction; complex parameter; complex reflection coefficient; five port reflectometer; oblique T-junction; Antenna measurements; Approximation methods; Electromagnetic waveguides; Electromagnetics; Mathematical model; Microwave theory and techniques; Reflection coefficient; complex reflection coefficient; multiport waveguide discontinuity; six-port;
Conference_Titel :
Mathematical Methods in Electromagnetic Theory (MMET), 2014 International Conference on
Conference_Location :
Dnipropetrovsk
Print_ISBN :
978-1-4799-6863-3
DOI :
10.1109/MMET.2014.6928757
