Title :
A practical approach to testing electronic equipment for susceptibility to AC line transients
Author :
Buschke, Henry A.
Author_Institution :
Zenith Electron. Corp., Glenview, CA, USA
fDate :
10/1/1988 12:00:00 AM
Abstract :
Modern electronic equipment is very susceptible to damage due to AC line transients. This paper describes a relatively simple procedure for testing the equipment for susceptibility to line transients and describes some low cost equipment for performing two types of simulated tests. The susceptibility of the equipment under test, based on the test results, is assessed
Keywords :
electronic equipment testing; failure analysis; reliability; surge protection; test equipment; transients; AC line transients; electronic equipment testing; reliability; susceptibility to line transients; test equipment; Costs; Design engineering; Electronic equipment; Electronic equipment testing; Lightning; Performance evaluation; Reliability engineering; Surge protection; Surges; Test equipment;
Journal_Title :
Reliability, IEEE Transactions on