Title :
A general circuit for resistive bridge sensors with bitstream output
Author :
Fasoli, Luca G. ; Riedijk, Frank R. ; Huijsing, Johan H.
Author_Institution :
Dipt. di Elettronica, Politecnico di Milano, Italy
fDate :
8/1/1997 12:00:00 AM
Abstract :
A low-offset integrated circuit useful for the readout of the signal coming from various types of integrated resistive bridge sensors has been developed in standard bipolar technology. The circuit, using a first order Σ-Δ A/D converter, provides a clock-synchronous pulse rate output which is highly suitable for the communication with a microprocessor and for a bus environment. An almost perfect offset cancellation is achieved by chopping the bridge voltage supply. The simplicity of the circuit makes it ideal for the integration with the sensors itself, while the digital interference rejection allows the integration of the digital control circuits for the bus on the same chip. The experimental results show that with a clock frequency of 200 kHz a resolution of 12 bits is obtained with a conversion time of 20 ms. The remaining offset is ±5 μV. The bridge imbalance can be up to 18 mV/V. Depending on the chosen resolution the input signal bandwidth could be from about 25 Hz (12 bits) up to 400 Hz (8 bits)
Keywords :
bipolar integrated circuits; bridge circuits; choppers (circuits); intelligent sensors; sigma-delta modulation; signal processing equipment; 20 ms; 200 kHz; 25 to 400 Hz; bitstream output; bridge imbalance; bridge voltage supply; clock frequency; clock-synchronous pulse rate output; conversion time; digital control circuits; digital interference rejection; first order Σ-Δ A/D converter; integrated resistive bridge sensors; microprocessor; offset cancellation; readout; resistive bridge sensors; resolution; signal bandwidth; standard bipolar technology; Bipolar integrated circuits; Bridge circuits; Clocks; Integrated circuit technology; Interference; Microprocessors; Pulse circuits; Signal resolution; Standards development; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on