Title :
Test of subranging A/D converters with digital correction
Author :
Chiorboli, Giovanni ; Boni, Andrea ; Franco, Giovanni
Author_Institution :
Parma Univ., Italy
fDate :
8/1/1997 12:00:00 AM
Abstract :
A test methodology based on linear modeling of subranging analog-to-digital converters with digital correction is proposed. A reduced physical model of integral nonlinearity errors is obtained by the application of the ambiguity algorithm. Simulation results are provided which demonstrate that an appreciable reduction of the number of test points can be obtained, thus reducing the high costs of testing, with low prediction errors
Keywords :
analogue-digital conversion; circuit analysis computing; circuit testing; error correction; fault diagnosis; A/D converters; QR factorisation; ambiguity algorithm; digital correction; fault modelling; integral nonlinearity errors; linear modeling; prediction errors; reduced physical model; subranging A/D converters; Analog-digital conversion; Clocks; Costs; Error correction; Helium; Logic devices; Logic testing; Predictive models; Production; Redundancy;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
