Title :
Life Performance of Zinc-Oxide Element Under DC Voltage
Author :
Oyama, M. ; Ohshima, I. ; Honda, M. ; Yamashita, M. ; Kojima, S.
Author_Institution :
Toshiba Corporation, Kawasaki, Japan
fDate :
6/1/1982 12:00:00 AM
Keywords :
Arresters; Chemical elements; Degradation; Leakage current; Life estimation; Life testing; Manufacturing processes; Temperature; Voltage; Zinc oxide;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1982.5520977
