DocumentCode
12555
Title
Optimization of Conductance Change in Pr1–x Cax MnO3-Based Synaptic Devices for Neuromorphic Systems
Author
Jun-Woo Jang ; Sangsu Park ; Burr, Geoffrey W. ; Hyunsang Hwang ; Yoon-Ha Jeong
Author_Institution
Dept. of Creative IT Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Volume
36
Issue
5
fYear
2015
fDate
May-15
Firstpage
457
Lastpage
459
Abstract
The optimization of conductance change behavior in synaptic devices based on analog resistive memory is studied for the use in neuromorphic systems. Resistive memory based on Pr1-xCaxMnO3 (PCMO) is applied to a neural network application (classification of Modified National Institute of Standards and Technology handwritten digits using a multilayer perceptron trained with backpropagation) under a wide variety of simulated conductance change behaviors. Linear and symmetric conductance changes (e.g., self-similar response during both increasing and decreasing device conductance) are shown to offer the highest classification accuracies. Further improvements can be obtained using nonidentical training pulses, at the cost of requiring measurement of individual conductance during training. Such a system can be expected to achieve, with our existing PCMO-based synaptic devices, a generalization accuracy on a previously-unseen test set of 90.55%. These results are promising for hardware demonstration of high neuromorphic accuracies using existing synaptic devices.
Keywords
calcium compounds; manganese compounds; neural nets; optimisation; praseodymium compounds; resistive RAM; semiconductor device models; Modified National Institute of Standards and Technology; PCMO; Pr1-xCaxMnO3; analog resistive memory; conductance change optimization; linear conductance; multilayer perceptron; neural network application; neuromorphic systems; symmetric conductance changes; synaptic devices; Accuracy; Biological neural networks; Hardware; Neuromorphics; Performance evaluation; Training; Resistive random-access memory (ReRAM); bio-inspired system; hardware neural network (HNN); long-term depression (LTD); long-term potentiation (LTP); memristor;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2015.2418342
Filename
7078840
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