• DocumentCode
    1256155
  • Title

    Defect Oriented Testing for Analog/Mixed-Signal Designs

  • Author

    Kruseman, B. ; Tasic, B. ; Hora, C. ; Dohmen, J. ; Hashempour, H. ; van Beurden, M. ; Xing, Yan

  • Author_Institution
    NXP Semicond., Eindhoven, Netherlands
  • Volume
    29
  • Issue
    5
  • fYear
    2012
  • Firstpage
    72
  • Lastpage
    80
  • Abstract
    In this contribution, the authors describe an application of Defect Oriented Testing (DOT) to commercial mixed-signal designs. A major challenge of DOT application to these designs is the enormous simulation time typically required. The authors address this major challenge with a new algorithm that provides a significant speed-up of over 100x, while at the same time reduces test time by 48% and improves fault coverage by 15%.
  • Keywords
    integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; analog/mixed signal design; defect oriented testing; new algorithm; Analytical models; Bridge circuits; Circuit faults; Computational modeling; Integrated circuit modeling; US Department of Transportation;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2012.2210852
  • Filename
    6255870
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1256155