An mK×nK bouwblok CCD image sensor family. II. Characterization

Author

Kreider, Greg ; Dillen, Bart G M ; Heijns, Henk ; Korthout, Laurens ; Roks, Edwin

Author_Institution

Cypress Semicond., Nashua, NH, USA

Volume

49

Issue

3

fYear

2002

fDate

3/1/2002 12:00:00 AM

Firstpage

370

Lastpage

376

Abstract

For pt. I see ibid., vol. 49, no. 3, p. 361-69 (2002). This paper characterizes the performance of four sensors from the bouwblok family. The original design meets the key original design goals, including the maximum packet size Q_max, readout speed, antiblooming protection, and optical performance. Three-level vertical clocks are used to reach more than 12-bits linear dynamic range at 60°C, and the binning capacity is limited at the floating diffusion and in the horizontal register. The dark current is low for a modern non-MPP (multiphase pinned) technology (0.3 nA/cm²). The performance of the design is consistent (for identical clocking conditions at the pixel) across all members of the family

Keywords

CCD image sensors; dark conductivity; integrated circuit noise; optical transfer function; 60 degC; MTF; antiblooming protection; binning capacity; bouwblok CCD image sensor family; dark current; floating diffusion; high dynamic range; horizontal register; image sensor characterization; maximum packet size; optical performance; readout speed; three-level vertical clocks; Charge-coupled image sensors; Chirp modulation; Clocks; Dark current; Dynamic range; Image sensors; Optical design; Pixel; Protection; Sensor phenomena and characterization;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.987105

Filename

987105