• DocumentCode
    1256604
  • Title

    Picosecond electro-optic probing of high-speed integrated circuits using external GaAs tip

  • Author

    Nagatsuma, Tadao ; Shinagawa, Mitsuru

  • Author_Institution
    NTT LSI Lab., Kanagawa, Japan
  • Volume
    27
  • Issue
    21
  • fYear
    1991
  • Firstpage
    1904
  • Lastpage
    1905
  • Abstract
    External electro-optic sampling has been demonstrated on high-speed integrated circuits using a pulse-compressed mode-locked Nd:YAG laser and a sophisticated GaAs probe tip. The measurement at frequencies up to 40 GHz has been successfully performed with excellent voltage sensitivity of less than 3 mV/ square root (Hz).
  • Keywords
    III-V semiconductors; digital integrated circuits; electro-optical devices; gallium arsenide; integrated circuit testing; measurement by laser beam; probes; 40 GHz; YAG:Nd laser; YAl5O12:Nd; electro-optic sampling; external GaAs tip; high-speed integrated circuits; picosecond electro-optic probing; pulse-compressed mode-locked;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911182
  • Filename
    98838
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1256604