Title :
Performance of dual-stripe giant magnetoresistive heads on tape
Author :
Cardoso, Susana ; Freitas, Paulo P.
Author_Institution :
INESC, Porto, Portugal
fDate :
9/1/1999 12:00:00 AM
Abstract :
Dual-stripe giant magnetoresistive (DSGMR) devices with an insulating spacer were fabricated and tested on tape media. The head design consists of two mutually biased, unshielded GMR elements based on [Cu 19 Å/NiFe 13 Å/CoFe 4Å]×10 antiferromagnetically coupled multilayers, separated by a 600-Å-thick SiO2 spacer. The sensor is patterned into a U shape, with leads connected away from the active region to avoid topography. Simultaneous etching of both GMR elements avoids misalignment problems along or across the track width. A DSGMR tape head operating in differential mode (track width of 2 μm and height of 0.8 μm) was tested versus high density dibits (0.05<bit<4 μm) recorded on tape media, using a current bias of J=2.8×107 A/cm2 on each GMR. The DSGMR responds to the dibit with a bipolar pulse independently of bit separation even when the individual GMR elements are partially saturated. Peak-to-peak output is 1.7 mV/μm, for bit sizes ⩾0.4 μm. Experimental pulse amplitude and shape are in agreement with a two-dimensional micromagnetic simulation. The head response to a dibit signal loses half its maximum amplitude for a recorded bit size of 0.2 pm. Pulse broadening (read bit cell is 0.8 μm larger than recorded bit, for bit sizes <0.4 μm) is correlated with sensor geometry
Keywords :
cobalt alloys; copper; etching; giant magnetoresistance; magnetic heads; magnetic multilayers; magnetic tape equipment; magnetoresistive devices; nickel alloys; 0.8 micron; 2 micron; Cu-NiFe-CoFe; bipolar pulse; current bias; differential mode; dual-stripe giant magnetoresistive heads; head response; high density dibits; insulating spacer; recorded bit size; sensor geometry; simultaneous etching; tape head; tape media; track width; two-dimensional micromagnetic simulation; unshielded GMR elements; Antiferromagnetic materials; Etching; Giant magnetoresistance; Insulation life; Magnetic heads; Magnetic multilayers; Mutual coupling; Shape; Surfaces; Testing;
Journal_Title :
Magnetics, IEEE Transactions on