Title :
On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front Ends
Author :
Ramzan, Rashad ; Ahsan, Naveed ; Dabrowski, Jerzy
Author_Institution :
Linkoping Univ., Linkoping, Sweden
Abstract :
This paper presents the design and measurement of a stimulus generator suitable for on-chip RF test aimed at gain, 1-dB compression point (CP), and the blocking profile measurement. Implemented in a 90-nm complementary metal-oxide-semiconductor (CMOS), the generator consists of two low-noise voltage-controlled ring oscillators (VCOs) and an adder. It can generate a single- or two-tone signal in a range of 0.9-5.6 GHz with a tone spacing of 3 MHz to 4.5 GHz and adjustable output power. The VCOs are based on symmetrically loaded double-differential delay line architecture. The measured phase noise is -80 dBc/Hz at an offset frequency of 1 MHz for the oscillation frequency of 2.4 GHz. A single VCO consumes 26 mW at 1 GHz while providing -10-dBm power into a 50-Ω load. The silicon area of the complete test circuit including coupling capacitors is only 0.03 mm2, while a single VCO occupies 0.012 mm2. The measured gain, 1-dB CP, and blocking profile of the wideband receiver using the on-chip stimulus generator are within ±8%, ±10%, and ±18% of their actual values, respectively. These error values are acceptable for making a pass or fail decision during production testing.
Keywords :
CMOS integrated circuits; design for testability; integrated circuit testing; radiofrequency integrated circuits; voltage-controlled oscillators; CMOS; adder; blocking profile measurement; blocking profile test; complementary metal-oxide-semiconductor; coupling capacitors; frequency 0.9 GHz to 5.6 GHz; frequency 3 MHz to 4.5 GHz; low-noise voltage-controlled ring oscillators; on-chip RF test; on-chip stimulus generator; phase noise; power 26 mW; production testing; resistance 50 ohm; size 90 nm; symmetrically loaded double-differential delay line architecture; tone spacing; wideband RF front ends; wideband receiver; Adders; Circuit testing; Gain measurement; Generators; Linearity; Phase noise; Power generation; Radio frequency; Ring oscillators; Signal generators; System-on-a-chip; Tuning; Voltage-controlled oscillators; Wideband; On-chip RF testing; RF design for testability (DfT); RF test; stimulus generator; voltage-controlled oscillator (VCO);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2009.2036454