DocumentCode :
1257844
Title :
Column-Parallel Digital Correlated Multiple Sampling for Low-Noise CMOS Image Sensors
Author :
Chen, Yue ; Xu, Yang ; Mierop, Adri J. ; Theuwissen, Albert J P
Author_Institution :
Electron. Instrum. Lab., Delft Univ. of Technol., Delft, Netherlands
Volume :
12
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
793
Lastpage :
799
Abstract :
This paper presents a low-noise CMOS image sensor using column-parallel high-gain signal readout and digital correlated multiple sampling (CMS). The sensor used is a conventional 4T active pixel with a pinned-photodiode as detector. The test sensor has been fabricated in a 0.18 μm CMOS image sensor process from TSMC. The random noise from the pixel readout chain is reduced in two stages, first using a high gain column parallel amplifier and second by using the digital CMS technique. The dark random noise measurement results show that the proposed column-parallel circuits with digital CMS technique is able to achieve 127 μVrms input referred noise. The significant reduction in the sensor read noise enhances the sensor´s signal-to-noise ratio (SNR) with 10.4 dB. Such sensors are very attractive for low-light imaging applications which demand high SNR values.
Keywords :
CMOS image sensors; amplifiers; analogue-digital conversion; digital readout; image enhancement; photodetectors; photodiodes; random noise; signal processing equipment; SNR; TSMC CMOS image sensor process; column-parallel circuit; column-parallel digital CMS technique; column-parallel digital correlated multiple sampling technique; column-parallel high-gain signal readout; conventional 4T active pixel; dark random noise measurement; high gain column parallel amplifier; input referred noise; low-light imaging application; low-noise CMOS image sensor; noise figure 10.4 dB; pinned-photodiode detector; pixel readout chain; signal-to-noise ratio; size 0.18 mum; Capacitors; Gain; Noise; Pixel; Radiation detectors; Thermal noise; 4T active pixel sensor; CMOS image sensor; digital CMS; low-light level imaging; low-noise column-parallel circuits;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2011.2160391
Filename :
5930316
Link To Document :
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