DocumentCode :
1261147
Title :
Cavity coupling structure for planar oscillators showing DR-like reflective characteristics
Author :
Kim, N. ; Kwon, Y.
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Volume :
38
Issue :
5
fYear :
2002
fDate :
2/28/2002 12:00:00 AM
Firstpage :
210
Lastpage :
211
Abstract :
A new cavity coupling structure has been developed for low-phase noise oscillator applications. Unlike the conventional cavity coupling structures that show absorption at the resonant frequency, the new structure shows high reflection at resonance similar to dielectric resonators, making it suitable for the reflective oscillators. The fabricated cavity resonator showed a loaded Q-factor of 1200 and the X-band oscillator using the new resonator showed phase noise proper-ties of -57 and -83 dBc/Hz at 1 and 10 kHz offset, respectively. This is comparable to the best results of dielectric resonator oscillators using HEMTs at this frequency range
Keywords :
HEMT circuits; cavity resonators; circuit stability; electron device noise; microwave oscillators; phase noise; waveguide couplers; 1 kHz; 1 kHz offset; 10 kHz; 10 kHz offset; HEMT oscillator stability; X-band oscillator; absorption; cavity coupling structure; dielectric resonators; loaded Q-factor 1200; phase noise; planar oscillators; reflection; reflective oscillators; resonance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20020170
Filename :
990199
Link To Document :
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