Title :
Inverse Profiling via an Effective Linearized Scattering Model and MRF Regularization
Author :
Autieri, Roberta ; D´Urso, Michele ; Isernia, Tommaso ; Pascazio, Vito
Author_Institution :
Dipt. per le Tecnol., Univ. degli Studi di Napoli Parthenope, Naples, Italy
Abstract :
The aim of this letter is to show how a joint adoption of a suitable regularization scheme and a proper rewriting of the traditional electromagnetic scattering equation allows introducing an interesting linear inversion tool which allows achieving nice reconstructions in many cases of practical interest. In particular, an innovative inversion approach which takes definite advantage from the joint use of the Contrast Source-Extended Born model and a Markov-random-field-based regularization scheme is proposed. Numerical examples, confirming accuracy usefulness, are reported and discussed.
Keywords :
Markov processes; electromagnetic wave scattering; microwave imaging; microwave propagation; random processes; MRF regularization; Markov random field based regularization; contrast source-extended Born model; effective linearized scattering model; electromagnetic scattering equation; inverse profiling; linear inversion tool; Computational modeling; Estimation; Image reconstruction; Markov processes; Mathematical model; Permittivity; Scattering; Contrast Source-Extended Born (CS-EB); Markov random fields (MRFs); inverse scattering; linear inversion;
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
DOI :
10.1109/LGRS.2011.2147757