Interference effects of multiple pulses on microcontroller

Author

Hui Zhang ; Lihua Shi ; Yinghui Zhou ; Rupo Ma

Author_Institution

Nat. Key Lab. on Electromagn. Environ. Effects & Electro-Opt. Eng., PLA Univ. of Sci. & Technol., Nanjing, China

fYear

2014

fDate

16-23 Aug. 2014

Firstpage

1

Lastpage

4

Abstract

In order to investigate the interference effect of multiple pulses on modern microelectronic devices, a test module based on CAN (Controller Area Network) bus technique for distributed control is designed. More than a hundred modules are prepared for statistic test. Pulse injection test is carried out to measure the variation of interference threshold under electromagnetic pulse (EMP). The threshold voltage under two situations, multiple pulses with different number and with different time interval are considered. Accumulative effects of multiple pulses are observed and discussed.

Keywords

controller area networks; distributed control; field buses; microcontrollers; statistical testing; CAN bus technique; EMP; controller area network; distributed control; electromagnetic pulse; interference effect; microcontroller; microelectronic device; pulse injection test; statistic test; test module; threshold voltage; time interval; EMP radiation effects; Interference; Microcontrollers; Monitoring; Threshold voltage; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

General Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI

Conference_Location

Beijing

Type

conf

DOI

10.1109/URSIGASS.2014.6929513

Filename

6929513