Title :
Characterizing substrate coupling in deep-submicron designs
Author :
Silveira, Luis Miguel ; Vargas, Nuno
Author_Institution :
Inst. Superior Tecnico, Tech. Univ. Lisbon, Portugal
Abstract :
The accurate modeling of noise-coupling effects caused by crosstalk through the substrate is an increasingly important concern for design and verification of analog, digital, and mixed systems. With the technique described here, designers can efficiently extract accurate substrate-coupling parameters from deep-submicron designs
Keywords :
crosstalk; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; substrates; analog systems; crosstalk; deep-submicron designs; digital systems; mixed systems; noise-coupling modeling; substrate; verification; Circuit noise; Circuit testing; Coupling circuits; Crosstalk; Data mining; Delay; Fabrication; Finite difference methods; Phase noise; Switching circuits;
Journal_Title :
Design & Test of Computers, IEEE
