DocumentCode :
1261667
Title :
Panel Summaries - ITC 2001 panels: part 2
Author :
Stolicny, Carol
Author_Institution :
Intel
Volume :
19
Issue :
2
fYear :
2002
Firstpage :
74
Lastpage :
76
Keywords :
AC generators; Automatic test pattern generation; Automatic testing; Built-in self-test; Design for testability; Economic forecasting; Environmental economics; Manufacturing; Microprocessors; Process design;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2002.990446
Filename :
990446
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1261667
