Effect of Cr sub-seed layer thickness on the crystallographic orientation of Co-alloy recording media on glass

Author

Chen, Qixu ; Yen, Edward ; Chen, Jianping ; Ristau, Roger ; Ranjan, Rajiv

Author_Institution

Seagate Recording Media Oper., Fremont, CA, USA

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

2637

Lastpage

2639

Abstract

Films with Cr sub-seed layer/NiAl/Cr-alloy/Co-alloy structure were sputter-deposited on surface-oxidized NiP layers on glass substrates. The effects of Cr sub-seed layer thickness on crystallographic orientation, grain size distribution, magnetic properties and recording performance were investigated. The recording performance of uni-crystal and bi-crystal media is compared and its correlation with grain size is discussed

Keywords

aluminium alloys; chromium; chromium alloys; cobalt alloys; crystal orientation; ferromagnetic materials; grain size; hard discs; magnetic recording noise; magnetic thin film devices; nickel alloys; sputtered coatings; bi-crystal media; crystallographic orientation; grain size distribution; recording media; recording performance; sputter-deposited films; sub-seed layer thickness; uni-crystal media; Chromium alloys; Cobalt alloys; Crystallography; Glass; Grain size; Magnetic films; Magnetic properties; Magnetic recording; Substrates; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800923

Filename

800923