DocumentCode :
1262453
Title :
A Practical Probabilistic Method to Evaluate Tolerable Step and Touch Voltages
Author :
Wang, Wen ; Velazquez, Raul ; Mukhedkar, Dinkar ; Gervais, Yvon
Author_Institution :
Jilin Power Design Institute, Peoples Republic of China
Issue :
12
fYear :
1984
Firstpage :
36
Lastpage :
36
Keywords :
Contact resistance; Distribution functions; Electric shock; Grounding; Immune system; Probability; Random variables; Sensitivity analysis; Voltage;
fLanguage :
English
Journal_Title :
Power Engineering Review, IEEE
Publisher :
ieee
ISSN :
0272-1724
Type :
jour
DOI :
10.1109/MPER.1984.5526222
Filename :
5526222
Link To Document :
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