Title :
A Practical Probabilistic Method to Evaluate Tolerable Step and Touch Voltages
Author :
Wang, Wen ; Velazquez, Raul ; Mukhedkar, Dinkar ; Gervais, Yvon
Author_Institution :
Jilin Power Design Institute, Peoples Republic of China
Keywords :
Contact resistance; Distribution functions; Electric shock; Grounding; Immune system; Probability; Random variables; Sensitivity analysis; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1984.5526222
