DocumentCode :
1263913
Title :
Universal Aging?
Issue :
11
fYear :
1984
Firstpage :
20
Lastpage :
21
Keywords :
Aging; Charge carrier processes; Chemical engineering; Chemical processes; Circuit breakers; Circuits; Contacts; Current; Educational institutions; Electron traps; Etching; Silicon; Transistors;
fLanguage :
English
Journal_Title :
Power Engineering Review, IEEE
Publisher :
ieee
ISSN :
0272-1724
Type :
jour
DOI :
10.1109/MPER.1984.5526497
Filename :
5526497
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1263913
