DocumentCode :
1265238
Title :
Experimental Study of the Variation in Oscillation Characteristics of Point-Contact-Based Spin-Torque Oscillators
Author :
Tamaru, S. ; Ricketts, D.S.
Author_Institution :
Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA
Volume :
3
fYear :
2012
fDate :
7/4/1905 12:00:00 AM
Firstpage :
3000504
Lastpage :
3000504
Abstract :
This paper presents an experimental study of the variation in oscillation characteristics of circular point-contact-based spin-torque oscillators (PC-STOs). We first measured the oscillation behavior of multiple, identically fabricated PC-STOs, then made the same measurements on a PC-STO and rotated the azimuth angle of the bias field \\varphi . Our results show considerable device-to-device variations among identical PC-STOs. More striking is large changes within a single PC-STO for a small \\varphi rotation, which is totally inconsistent with the geometrical symmetry of the device. These results suggest that the giant magnetoresistance stack has some form of microstructural inhomogeneity, which causes a strong \\varphi dependence of the oscillation behavior, eventually resulting in the device-to-device variation. Some possible sources of the inhomogeneity are discussed based on these observation results.
Keywords :
Current density; Magnetic devices; Magnetic films; Magnetoresistive devices; Oscillators; Spin electronics; magnetic microwave devices; magnetoresistive devices; oscillator stability; soft magnetic films;
fLanguage :
English
Journal_Title :
Magnetics Letters, IEEE
Publisher :
ieee
ISSN :
1949-307X
Type :
jour
DOI :
10.1109/LMAG.2012.2208098
Filename :
6269120
Link To Document :
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