DocumentCode
126983
Title
Reliability of two failure mode systems subject to correlated failures
Author
Fiondella, Lance ; Liudong Xing
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts-Dartmouth, North Dartmouth, MA, USA
fYear
2014
fDate
27-30 Jan. 2014
Firstpage
1
Lastpage
6
Abstract
The majority of reliability modeling techniques assume systems and their components exhibit a single mode of failure. However, many systems including hardware are susceptible to two or more distinct failure modes. Previous research on two failure mode systems derived analytical expressions to determine the number of components that will maximize system reliability or minimize system cost. However, these expressions are commonly obtained from models that assume component failures are statistically independent, an assumption that is often violated in practice. This paper presents models to explicitly characterize the impact of correlated failures on the reliability and cost of several common structures. The applications of the expressions are illustrated through a series of examples, which indicate that ignoring correlation can overestimate system reliability and underestimate system cost. Thus, the expressions presented in this work can quantify the impact of correlated failure on two failure mode systems so that actions can be taken to mitigate correlation´s potentially negative influence.
Keywords
failure analysis; reliability; component failure mode systems; correlated failures; reliability analysis; Correlation; Educational institutions; Equations; Frequency modulation; Mathematical model; Reliability; Sensitivity analysis; Reliability block diagram; correlated failures; multiple failure modes; system cost;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2014 Annual
Conference_Location
Colorado Springs, CO
Print_ISBN
978-1-4799-2847-7
Type
conf
DOI
10.1109/RAMS.2014.6798438
Filename
6798438
Link To Document