DocumentCode :
1270707
Title :
Extending the road beyond CMOS
Author :
Hutchby, James A. ; Bourianoff, George I. ; Zhirnov, Victor V. ; Brewer, Joe E.
Author_Institution :
Semicond. Res. Corp., Durham, NC, USA
Volume :
18
Issue :
2
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
28
Lastpage :
41
Abstract :
The accelerating pace of CMOS scaling is rapidly approaching the fundamental limits of MOSFET performance, even as the projected size of a high-performance and manufacturable MOSFET technology is currently being extended with growing confidence to the 22-nm node (featuring a 9-nm physical gate length). The new 2001 International Technology Roadmap for Semiconductors currently projects the industry to reach this node in 2016. However, this forecast assumes the traditional industry node-cycle cadence of a quadrupling of the number of transistors every three years for DRAMS and a return to the three-year cycle in 2004 for MPUs and ASICs. During the past several years the node cycles for MPUs have been accelerated to occur within two-year periods. This pace will bring the microelectronics industry to the end of silicon CMOS technology scaling sometime not later than 2016, and maybe as soon as 2010. The new Emerging Technologies section of the 2001 ITRS offers guidance on both sides of this problem: nanoelectronics for memory, logic, and information-processing architectures could possibly extend the time frame of the ITRS beyond CMOS
Keywords :
CMOS integrated circuits; integrated circuit technology; integrated logic circuits; integrated memory circuits; nanotechnology; 2001 ITRS; CMOS scaling; MOSFET performance limit; channel-engineered MOSFET structures; double-gate MOSFET structures; information-processing paradigm; microelectronics; nanoelectronic devices; nonclassical MOSFET structures; signal processing paradigms; Acceleration; CMOS technology; MOSFET circuits; Manufacturing industries; Microelectronics; Nanoelectronics; Random access memory; Roads; Semiconductor device manufacture; Silicon;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/101.994856
Filename :
994856
Link To Document :
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