DocumentCode :
1271089
Title :
Global Signal Vulnerability (GSV) Analysis for Selective State Element Hardening in Modern Microprocessors
Author :
Maniatakos, Michail ; Tirumurti, Chandrasekharan ; Galivanche, Rajesh ; Makris, Yiorgos
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Volume :
61
Issue :
10
fYear :
2012
Firstpage :
1361
Lastpage :
1370
Abstract :
Global Signal Vulnerability (GSV) analysis is a novel method for assessing the susceptibility of modern microprocessor state elements to failures in the field of operation. In order to effectively allocate design for reliability resources, GSV analysis takes into account the high degree of architectural masking exhibited in modern microprocessors and ranks state elements accordingly. The novelty of this method lies in the way this ranking is computed. GSV analysis operates either at the Register Transfer (RT-) or at the Gate-Level, offering increased accuracy in contrast to methods which compute the architectural vulnerability of registers through high-level simulations on performance models. Moreover, it does not rely on extensive Statistical Fault Injection (SFI) campaigns and lengthy executions of workloads to completion in RT- or Gate-Level designs, which would make such analysis prohibitive. Instead, it monitors the behavior of key global microprocessor signals in response to a progressive stuck-at fault injection method during partial workload execution. Experimentation with the Scheduler and Reorder Buffer modules of an Alpha-like microprocessor and a modern Intel microprocessor corroborates that GSV analysis generates a near-optimal ranking, yet is several orders of magnitude faster than existing RT- or Gate-Level approaches.
Keywords :
hardening; logic gates; microprocessor chips; GSV analysis; Intel microprocessor; SFI campaigns; alpha-like microprocessor; architectural masking; design allocation; gate-level; global signal vulnerability; high-level simulations; key global microprocessor signals; modern microprocessor state elements; modern microprocessors; near-optimal ranking; partial workload execution; register transfer; reliability resources; reorder buffer modules; scheduler modules; selective state element hardening; statistical fault injection; stuck-at fault injection method; Accuracy; Analytical models; Computational modeling; Latches; Microprocessors; Registers; Transient analysis; AVF; GSV; control logic; modern microprocessor; reliability; vulnerability analysis; workload.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2011.172
Filename :
6280561
Link To Document :
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