Title :
Foreword Special Issue on Characterization of Nano CMOS Variability by Simulation and Measurements
Author :
Sangiorgi, Enrico ; Asenov, Asen ; Bennett, Herbert S. ; Dutton, Robert W. ; Esseni, David ; Giles, M. D. ; Hane, M. ; Nishi, Kentaro ; Ranaweera, Jeewika ; Selberherr, Siegfried
Author_Institution :
University of Bologna, Bologna, , Italy
Abstract :
The five invited papers and 11 contributed papers in this special issue discuss topics such as process variation, device variability, hierarchical modeling tools, and address challenges such as device mismatch and SRAM noise margin variability.
Keywords :
CMOS technology; Circuit simulation; Nanoelectronics; Nanoscale devices; Special issues and sections;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2160884
