DocumentCode :
1274282
Title :
Design and Demonstration of an In-Plane Silicon-on-Insulator Optical MEMS Fabry–Pérot-Based Accelerometer Integrated With Channel Waveguides
Author :
Zandi, Kazem ; Bélanger, Joseph André ; Peter, Yves-Alain
Author_Institution :
Dept. of Eng. Phys., Ecole Polytech. de Montreal, Montréal, QC, Canada
Volume :
21
Issue :
6
fYear :
2012
Firstpage :
1464
Lastpage :
1470
Abstract :
In this paper, we present a novel optical microelectromechanical systems (MEMS) accelerometer sensor dedicated to space applications. An in-plane Fabry-Pérot (FP) microcavity (FPM) with two distributed Bragg reflectors (DBRs) is used to detect the acceleration. One of the DBR mirrors is attached to two suspended proof masses, allowing the FP gap to change while proof masses experience acceleration. Acceleration is then detected by measuring the spectral shift of the FPM. The optical accelerometer presented here uses silicon strip waveguides integrated with MEMS on a single silicon-on-insulator wafer, making it compact and robust. All of the device components are fabricated using one single fabrication step. Immunity to electromagnetic interference, high sensitivity and resolution capability, integrability, reliability, low cross-sensitivity, simple fabrication, and possibility of having two- and three-axis sensitivities are numerous advantages of our sensor compared to the conventional ones. The sensor performance demonstrated a 90-nm/g sensitivity and 111-μg resolution and better than 250-mg dynamic range.
Keywords :
accelerometers; distributed Bragg reflectors; electromagnetic interference; micro-optomechanical devices; microcavities; microfabrication; microsensors; optical sensors; optical waveguides; reliability; silicon-on-insulator; DBR mirrors; FP microcavity; FPM; channel waveguides; device components; distributed Bragg reflectors; electromagnetic interference immunity; in-plane Fabry-Pérot microcavity; in-plane silicon-on-insulator optical MEMS Fabry-Pérot-based accelerometer; low cross-sensitivity; optical microelectromechanical system accelerometer sensor; reliability; silicon strip waveguides; single silicon-on-insulator wafer; spectral shift measurement; suspended proof masses; three-axis sensitivity; Acceleration; Accelerometers; Distributed Bragg reflectors; Optical device fabrication; Optical sensors; Optical waveguides; Distributed Bragg reflector (DBR); Fabry–Pérot (FP); optical accelerometer; silicon-on-insulator (SOI); waveguides;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2012.2211577
Filename :
6287537
Link To Document :
بازگشت