Title :
Sensitivity Analysis of the Total Accident Probability of a Grounding System
Author :
Wang, Wen ; Mukhedkar, Dinkar ; Gervais, Yvon
Author_Institution :
Jilin Power Design Institute, Peoples Republic of China
fDate :
7/1/1985 12:00:00 AM
Keywords :
Accidents; Contact resistance; Grounding; Humans; Immune system; Probability; Random variables; Sensitivity analysis; Tellurium; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1985.5528470
