Title :
On the integration of design and test for chips embedding MEMS
Author :
Mir, Salvador ; Charlot, Benoit
Author_Institution :
TIMA Lab., France
Abstract :
This article illustrates how fault-based, defect-oriented test approaches can be applied to the problem of testing the next generation of chips embedding MEMS
Keywords :
logic CAD; logic testing; micromechanical devices; MEMS; chips; defect-oriented; design and test; embedded MEMS; fault-based; Automatic testing; Circuit faults; Circuit testing; Consumer electronics; Electronic equipment testing; Integrated circuit testing; Laboratories; Micromechanical devices; Silicon; System testing;
Journal_Title :
Design & Test of Computers, IEEE
