• DocumentCode
    1275619
  • Title

    Analog DFT using an undersampling technique

  • Author

    Mason, Ralph ; MA, Shing

  • Author_Institution
    Carleton Univ., Ottawa, Ont., Canada
  • Volume
    16
  • Issue
    4
  • fYear
    1999
  • Firstpage
    84
  • Lastpage
    88
  • Abstract
    This article presents a novel approach to analog design for test (DFT). The approach is based on wideband undersampling techniques using multiple samplers on-chip. Using this technique, signals being tested can be mixed down to lower frequencies before being brought off-chip
  • Keywords
    design for testability; analog design for test; multiple samplers on-chip; undersampling technique; Circuit testing; Convolution; Design for testability; Equations; Frequency response; Integrated circuit testing; Sampling methods; Switches; System testing; Wideband;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.808225
  • Filename
    808225
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1275619