• DocumentCode
    1280907
  • Title

    Direct extraction of nonlinear FET C-V functions from time domain large signal measurements

  • Author

    Currás-Francos, M.C. ; Tasker, P.J. ; Fernandez-Barciela, M. ; Campos-Roca, Y. ; Sánchez, E.

  • Author_Institution
    ETSI Telecomunicacion, Vigo Univ., Spain
  • Volume
    35
  • Issue
    21
  • fYear
    1999
  • fDate
    10/14/1999 12:00:00 AM
  • Firstpage
    1789
  • Lastpage
    1791
  • Abstract
    A simple technique for extracting the nonlinear intrinsic capacitances in a quasi-static HEMT model from large signal time domain microwave measurements is presented. This method is based on the use of a suitable load-pull configuration around a vector nonlinear network analyser
  • Keywords
    capacitance; high electron mobility transistors; microwave field effect transistors; microwave measurement; network analysers; semiconductor device measurement; semiconductor device models; time-domain analysis; large signal time domain microwave measurements; load-pull configuration; nonlinear FET C-V functions; nonlinear intrinsic capacitances; quasi-static HEMT model; time domain large signal measurements; vector nonlinear network analyser;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19991260
  • Filename
    809969