Title :
Direct extraction of nonlinear FET C-V functions from time domain large signal measurements
Author :
Currás-Francos, M.C. ; Tasker, P.J. ; Fernandez-Barciela, M. ; Campos-Roca, Y. ; Sánchez, E.
Author_Institution :
ETSI Telecomunicacion, Vigo Univ., Spain
fDate :
10/14/1999 12:00:00 AM
Abstract :
A simple technique for extracting the nonlinear intrinsic capacitances in a quasi-static HEMT model from large signal time domain microwave measurements is presented. This method is based on the use of a suitable load-pull configuration around a vector nonlinear network analyser
Keywords :
capacitance; high electron mobility transistors; microwave field effect transistors; microwave measurement; network analysers; semiconductor device measurement; semiconductor device models; time-domain analysis; large signal time domain microwave measurements; load-pull configuration; nonlinear FET C-V functions; nonlinear intrinsic capacitances; quasi-static HEMT model; time domain large signal measurements; vector nonlinear network analyser;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19991260
