DocumentCode :
1281933
Title :
CGIN: a fault tolerant modified Gamma interconnection network
Author :
Chuang, Po-Jen
Author_Institution :
Dept. of Electr. Eng., Tamkang Univ., Tamsui, Taiwan
Volume :
7
Issue :
12
fYear :
1996
fDate :
12/1/1996 12:00:00 AM
Firstpage :
1301
Lastpage :
1306
Abstract :
To improve the terminal reliability of the Gamma interconnection network (GIN), we consider altering its connecting patterns between stages to attain multiple disjoint paths between any source and destination pair. The new modified GIN, referred to as a CGIN with connecting patterns between stages exhibiting a cyclic feature, is able to tolerate any arbitrary single fault and to lift up terminal reliability accordingly. If several rows of switching elements are fabricated in one chip using the VLSI technology, a CGIN could lead to reduced cost because the pin count per chip decreases and the layout area taken by connections shrinks. To make routing and rerouting in the CGIN more efficient and simpler to implement, destination tag routing and rerouting is also provided
Keywords :
computational complexity; fault tolerant computing; multiprocessor interconnection networks; CGIN; connecting pattern; cyclic feature; destination tag routing; fault tolerant modified Gamma interconnection network; multiple disjoint paths; rerouting; routing; switching elements; terminal reliability; Costs; Fault tolerance; Hardware; Helium; Joining processes; Multiprocessor interconnection networks; Routing; Switches; Very large scale integration;
fLanguage :
English
Journal_Title :
Parallel and Distributed Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9219
Type :
jour
DOI :
10.1109/71.553298
Filename :
553298
Link To Document :
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